Opto-Electronic Engineering, Volume. 47, Issue 2, 190635(2020)

The study of test method of time characteristic for ultra-fast-MCP-PMT

Wang Yang1...2,*, Ma Xiurong1, Qian Sen2,3, Zhu Yao2,4, Wang Zhigang2,3, Gao Feng2,3, Ma Lishuang2,4, Chen Pengyu2,5, Li Haitao2,6, and Gao Bo23 |Show fewer author(s)
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    Wang Yang, Ma Xiurong, Qian Sen, Zhu Yao, Wang Zhigang, Gao Feng, Ma Lishuang, Chen Pengyu, Li Haitao, Gao Bo. The study of test method of time characteristic for ultra-fast-MCP-PMT[J]. Opto-Electronic Engineering, 2020, 47(2): 190635

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    Paper Information

    Category: Article

    Received: Oct. 15, 2019

    Accepted: --

    Published Online: Mar. 6, 2020

    The Author Email: Yang Wang (wangyang2018@ihep.ac.cn)

    DOI:10.12086/oee.2020.190635

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