Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

Guiyun Li; Liyuan Gu; Jingpei Hu; Linglin Zhu; Aijun Zeng; Huijie Huang

doi:10.3788/COL201917.011201

Chinese Optics Letters, Volume. 17, Issue 1, 011201(2019)

Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

Guiyun Li^1,2, Liyuan Gu^1,2, Jingpei Hu¹, Linglin Zhu¹, Aijun Zeng^1,2、*, and Huijie Huang^1,2

¹Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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Guiyun Li, Liyuan Gu, Jingpei Hu, Linglin Zhu, Aijun Zeng, Huijie Huang. Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view[J]. Chinese Optics Letters, 2019, 17(1): 011201

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Aug. 8, 2018

Accepted: Nov. 12, 2018

Posted: Nov. 14, 2018

Published Online: Jan. 17, 2019

The Author Email: Aijun Zeng (aijunzeng@siom.ac.cn)

DOI:10.3788/COL201917.011201

Topics

laser devices and laser physics

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Instrumentation, Measurement and Metrology