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Semiconductor Optoelectronics, Volume. 44, Issue 4, 493(2023)

Model Analysis of Breakdown Effects in Avalanche Photodetectors

LI Chong1,*... YANG Shuai1, LIU Yuewen1, XU Gang1, GUAN Kai1, LI Zhanjie1, LI Weize1 and LIU Yunfei2 |Show fewer author(s)
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    LI Chong, YANG Shuai, LIU Yuewen, XU Gang, GUAN Kai, LI Zhanjie, LI Weize, LIU Yunfei. Model Analysis of Breakdown Effects in Avalanche Photodetectors[J]. Semiconductor Optoelectronics, 2023, 44(4): 493

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    Received: Feb. 21, 2023

    Accepted: --

    Published Online: Nov. 26, 2023

    The Author Email: Chong LI (lichong@bjut.edu.cn)

    DOI:10.16818/j.issn1001-5868.2023022101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology