Optoelectronics Letters, Volume. 16, Issue 5, 369(2020)
Structural and plasma characterization of the power effect on the chromium thin film deposited by DC magnetron sputtering
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S. Alsheikh Salo, B. Abdallah, M. Akel, M. Kakhia. Structural and plasma characterization of the power effect on the chromium thin film deposited by DC magnetron sputtering[J]. Optoelectronics Letters, 2020, 16(5): 369
Received: Sep. 26, 2019
Accepted: Nov. 6, 2019
Published Online: Dec. 25, 2020
The Author Email: Salo S. Alsheikh (pscientific26@aec.org.sy)