Infrared and Laser Engineering, Volume. 34, Issue 1, 54(2005)

Interferometric measurement of near-cylindrical surfaces

[in Chinese]1,2、*, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
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    References(6)

    [1] [1] Patrick L Thompson,James E Harvey.The‘aplanatic'wolter type I telescope design:is there a practical advantage [A].SPIE[C].1998, 3444.526-542.

    [2] [2] Glatzel H,Schmid M,Egle W,et al.Assembly,performance prediction and X-ray test of the demonstration model ODM for the Xray telescope XMM [A].SPIE[C].1994,2210.360-372.

    [3] [3] Geary J M. Interferometry on grazing incidence optics [J]. Optical Engineering,1987 ,26(12):1125-1128 .

    [4] [4] Geary J M. Interferometry on Wolter X-ray optics:a possible approach[J]. Optical Engineering,1989,28(3): 217-221.

    [6] [6] Alfred Gatzweiler, Holger Glatzel. Interferometric measurement of near-cylindrical surfaces with high amplitude resolution[J].Applied optics, 1995, 34(31):7207-7212.

    [7] [7] Geary J M.New test for cylindrical optics[J].Optical Engineering, 1987, 26(8):813-820.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometric measurement of near-cylindrical surfaces[J]. Infrared and Laser Engineering, 2005, 34(1): 54

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    Paper Information

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    Received: Jul. 16, 2004

    Accepted: Sep. 5, 2004

    Published Online: May. 25, 2006

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