Online Monitoring of Hard X-Ray Beam at SSRF

Zhe Hu; Chunxia Hong; Wenqiang Hua; Yuzhu Wang; Xiuhong Li; Jie Wang

doi:10.3788/AOS202141.1534001

Acta Optica Sinica, Volume. 41, Issue 15, 1534001(2021)

Online Monitoring of Hard X-Ray Beam at SSRF

Zhe Hu^1,2,3, Chunxia Hong^2、**, Wenqiang Hua^2、*, Yuzhu Wang², Xiuhong Li², and Jie Wang^1,2

Author Affiliations

¹Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China

²Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China

³University of Chinese Academy of Science, College of Material Science and Opto·Electronic Technology, Beijing 100049, China;

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Figures & Tables(11)

Fig. 1. X-ray beam on-line monitoring device based on fluorescence imaging. (a) Structural schematic diagram; (b) physical scene map;(c)(d) existing structural schematic diagram of X-ray beam monitoring device based on fluorescence imaging

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Fig. 2. Layout of SSRF-USAXS beamline and the distribution of beam on-line monitors

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Fig. 3. Beam profiles at microfocus SAXS experimental station of SSRF-USAXS before and after focusing operation. (a) Diagram of working principle of reflection focusing mirror; (b) beam spot profile of secondary source; (c)(d) beam spot profiles before and after focusing

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Fig. 4. Dynamic monitoring of beam spot at USAXS experimental station; (a) Two-dimensional intensity profile, integrated intensity distributions and Gaussian fitting curves in both horizontal and vertical directions; (b) distribution of beam spot positions at different sampling frame rates

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Fig. 5. Changes in the position, flux, and size of the focus spot at USAXS experimental station with time under different sampling frame rates. (a) Horizontal/vertical spot position; (b) normalized luminous flu; (c) horizontal/vertical direction full width at half maximum change with time and frequency domain analysis (different sampling frame rates: 1, 10, and 100 frame/s)

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Fig. 6. Dynamic monitoring of beam spot at μSAXS experimental station. (a) Two-dimensional intensity profile, integrated intensity distributions and Gaussian fitting curves in both horizontal and vertical directions; (b) distribution of beam spot positions at different sampling frame rates

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Fig. 7. Changes in the position, flux, and size of the focus spot at μSAXS experimental station with time under different sampling frame rates. (a) Horizontal/vertical spot position; (b) normalized luminous flux; (c) horizontal/vertical direction full width at half maximum change with time and frequency domain analysis (different sampling frame rates: 1, 10, and 100 frame/s)

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Fig. 8. Real-time relative phase variation of incident wavefront at USAXS experimental station

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Table 1. Photon transmittance of a 30 μm thick B∶CVD fluorescent screen as a function of the X-ray energy
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Table 1. Photon transmittance of a 30 μm thick B∶CVD fluorescent screen as a function of the X-ray energy
Energy /keV 8 9 10 11 12 13 14 15
Photon transmittance/ % 95.5 96.9 97.7 98.3 98.7 98.9 99.1 99.3

Table 2. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot position, and width deviation at USAXS experimental station
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Table 2. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot position, and width deviation at USAXS experimental station
Frame rate /(frame·s^-1) 1 10 100
Flux /% 2.20 1.20 1.07
Beam spot (H %×V %) 3.49×1.56 2.84×1.38 2.43×1.34
Beam width (H %×V %) 0.10×0.38 0.08× 0.28 0.07×0.25

Table 3. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot positions, and width deviation at μSAXS experimental station
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Table 3. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot positions, and width deviation at μSAXS experimental station
Frame rate /(frame·s^-1) 1 10 100
Flux /% 2.82 2.81 2.84
Beam spot (H %×V %) 2.67×1.66 2.54×1.34 3.29×1.67
Beam width (H %×V %) 0.58× 0.39 0.35×0.43 0.37×0.37

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Zhe Hu, Chunxia Hong, Wenqiang Hua, Yuzhu Wang, Xiuhong Li, Jie Wang. Online Monitoring of Hard X-Ray Beam at SSRF[J]. Acta Optica Sinica, 2021, 41(15): 1534001

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Paper Information

Category: X-Ray Optics

Received: Jan. 26, 2021

Accepted: Mar. 8, 2021

Published Online: Aug. 11, 2021

The Author Email: Hong Chunxia (hongchunxia@zjlab.org.cn), Hua Wenqiang (huawenqiang@zjlab.org.cn)

DOI:10.3788/AOS202141.1534001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Photon transmittance of a 30 μm thick B∶CVD fluorescent screen as a function of the X-ray energy

Table 1. Photon transmittance of a 30 μm thick B∶CVD fluorescent screen as a function of the X-ray energy

Table 2. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot position, and width deviation at USAXS experimental station

Table 2. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot position, and width deviation at USAXS experimental station

Table 3. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot positions, and width deviation at μSAXS experimental station

Table 3. RMS value of the deviation of normalized beam flux, horizontal/vertical beam spot positions, and width deviation at μSAXS experimental station