Opto-Electronic Engineering, Volume. 37, Issue 4, 66(2010)

Automatic Mura Detection for TFT-LCD Based on Wavelet Multi-scale

GUAN Xin1、* and MOU Tong-sheng2,3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(10)

    [1] [1] CHOU Shang-ta. TFT-LCD Mura Defect Detection using Wavelet Transforms [D]. Taipei:National Taipei University of Technology,2006:15-18.

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    [5] [5] Chen C -C. A study of defects of LCD panel with wavelet method [D]. Taipei:Department of Electrical Engineering, Yuan Ze University,2005:28-35.

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    [7] [7] LU Chi-jie,TSAI Du-ming. Automatic Defect Inspection for LCDs Using Singular Value Decomposition [J]. International Journal of Advanced Manufacturing Technology(S0268-3768),2005,25:53-61.

    [8] [8] Mori Y,Tanahashi K,Tsuji S. Quantitative evaluation of Mura in liquid crystal displays [J]. Optical Engineering (S0091-3286),2004,43(11):2696-2700.

    [9] [9] Pratt W R. Digital Image Processing [M]. New York:Wiley,1977:50-65.

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    GUAN Xin, MOU Tong-sheng. Automatic Mura Detection for TFT-LCD Based on Wavelet Multi-scale[J]. Opto-Electronic Engineering, 2010, 37(4): 66

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    Paper Information

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    Received: Jan. 27, 2010

    Accepted: --

    Published Online: Jun. 13, 2010

    The Author Email: Xin GUAN (guanxin01@126.com)

    DOI:10.3969/j.issn.1003-501x.2010.04.013

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