Opto-Electronic Engineering, Volume. 37, Issue 4, 66(2010)
Automatic Mura Detection for TFT-LCD Based on Wavelet Multi-scale
[1] [1] CHOU Shang-ta. TFT-LCD Mura Defect Detection using Wavelet Transforms [D]. Taipei:National Taipei University of Technology,2006:15-18.
[2] [2] CHENG Zheng-xing. Data Fitting [M]. Xi’an:Xi’an Jiaotong University Press,1986.
[3] [3] Hecht S. The visual discrimination of intensity and the Weber-Fechner law [J]. Gen. Physiol(S0231-5882),1924,7:241-242.
[4] [4] Blackwell H R. Contrast threshold of the human eye [J]. Opt. Soc. Amer (S0740-3224),1946,36:624-643.
[5] [5] Chen C -C. A study of defects of LCD panel with wavelet method [D]. Taipei:Department of Electrical Engineering, Yuan Ze University,2005:28-35.
[6] [6] Jain R,Kasturi R,Schunck B G. Machine Vision [M]. New York:McGraw-Hill,1995:60-104.
[7] [7] LU Chi-jie,TSAI Du-ming. Automatic Defect Inspection for LCDs Using Singular Value Decomposition [J]. International Journal of Advanced Manufacturing Technology(S0268-3768),2005,25:53-61.
[8] [8] Mori Y,Tanahashi K,Tsuji S. Quantitative evaluation of Mura in liquid crystal displays [J]. Optical Engineering (S0091-3286),2004,43(11):2696-2700.
[9] [9] Pratt W R. Digital Image Processing [M]. New York:Wiley,1977:50-65.
[10] [10] Pratt William K. Machine Vision Methods for Automatic Defect Detection in Liquid Crystal Displays [J]. Advanced Imaging (S1042-0711),1998,13(4):52-54
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GUAN Xin, MOU Tong-sheng. Automatic Mura Detection for TFT-LCD Based on Wavelet Multi-scale[J]. Opto-Electronic Engineering, 2010, 37(4): 66
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Received: Jan. 27, 2010
Accepted: --
Published Online: Jun. 13, 2010
The Author Email: Xin GUAN (guanxin01@126.com)