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Optoelectronics Letters, Volume. 16, Issue 3, 225(2020)

GAN-based data augmentation of prohibited item X-ray images in security inspection

Yue ZHU1... Hai-gang ZHANG2, Jiu-yuan AN1 and Jin-feng YANG2,* |Show fewer author(s)
Author Affiliations
  • 1Tianjin Key Lab for Advanced Signal Processing, Civil Aviation University of China, Tianjin 300300, China
  • 2Institute of Applied Articial Intelligence of the Guangdong-Hong Kong-Macao Greater Bay Area, Shenzhen Polytechnic, Shenzhen 518055, China
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    ZHU Yue, ZHANG Hai-gang, AN Jiu-yuan, YANG Jin-feng. GAN-based data augmentation of prohibited item X-ray images in security inspection[J]. Optoelectronics Letters, 2020, 16(3): 225

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    Paper Information

    Received: Jul. 11, 2019

    Accepted: Aug. 28, 2019

    Published Online: Dec. 25, 2020

    The Author Email: Jin-feng YANG (jfyang@szpt.edu.cn)

    DOI:10.1007/s11801-020-9116-z

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology