[1] [1] G Schulz, J Schwider. Precise measurement of planeness [J]. Appl Opt, 1967, 6(6): 1077-1084.

[2] [2] G Schulz, J Schwider. Establishing an optical flatness [J]. Appl Opt, 1971, 10(4): 929-934.

[3] [3] B S Fritz. Absolute calibration of an optical flat [J]. Opt Eng, 1984, 23(4): 379-383.

[4] [4] V Greco, R Tronconi, C Del Vecchio, et al.. Absolute measurement of planarity with Fritz′s method: uncertainty evaluation [J]. Appl Opt, 1999, 38(10): 2018-2027.

[5] [5] Miao Erlong, Su Dongqi, Peng Shijun. High precise absolute flat calibration [J]. Laser & Optoelectronics Progress, 2014, 51(5): 051203.

[6] [6] M Vannoni, G Molesini. Iterative algorithm for three flat test [J]. Opt Express, 2007, 15(11): 6809-6816.

[7] [7] M Vannoni, G Molesini. Absolute planarity with three flat test: an iterative approach with Zernike polynomials [J]. Opt Express, 2008, 16(1): 340-354.

[8] [8] Song Weihong, Wu Fan, Hou Xi. Study on the absolute testing of rotationally asymmetric surface deviation with the method of single rotation [J]. Acta Optica Sinica, 2012, 32(9): 0912006.

[9] [9] He Yuhang, Chai Liqun, Chen Bo, et al.. Error compensation method for mirror symmetry absolute measurement [J]. Acta Optica Sinica, 2013, 33(4): 0412003.

[10] [10] Chen Xu, Yuan Wenquan, Feng Yutao, et al.. Study of the error reference lens in absolute spherical testing and the thermal deformation model establishment [J]. Acta Optica Sinica, 2011, 31(2): 0212002.

[11] [11] Chen Xu, Lei Chen, Jiayi Yin. Method for absolute flatness measurement of optical surfaces [J]. Appl Opt, 2009, 48(13): 2536-2540.

[12] [12] Sun Wenqing, Chen Lei, He Yong, et al.. Two flat test solutions based on frequency domain transform [J]. Journal of Optoelectronics·Laser, 2012, 23(3): 542-545.