Infrared Technology, Volume. 42, Issue 6, 598(2020)
Defect Detection of Landfill Bare Film Based on Infrared Imaging Technology
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CHEN Yayu, ZHAGN Wei, SUN Huanyi, HUANG Xiaosong. Defect Detection of Landfill Bare Film Based on Infrared Imaging Technology[J]. Infrared Technology, 2020, 42(6): 598
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