Opto-Electronic Engineering, Volume. 33, Issue 7, 63(2006)
Theory analyses of moiré stripe in 3-D profilometry measurement
References(2)
[1] [1] Yoshiharu Morimoto,Harold E,Daniel Post.Carrier pattern analysis of moire interferometry using the Fourier transforms moiré method[J].Opt.Eng,1994,33(8):2646-2653.
[2] [2] Daniel Post.Moiré interferometry for engineering and science[J].Proc.SPIE,2005,5776:29-43.
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[in Chinese], [in Chinese]. Theory analyses of moiré stripe in 3-D profilometry measurement[J]. Opto-Electronic Engineering, 2006, 33(7): 63
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