[1] Lin S T, Le Q H, Chen S H et al. Heterodyne polariscope for measuring the principal angle and phase retardation of stressed plastic substrates[J]. Measurement, 175, 109096(2021).

[2] Chen Q H, Zhou S, Ding J H et al. Three-dimensional temperature field measurement based on multi-step phase shift method and polarization interference optical tomography optical path[J]. Acta Optica Sinica, 42, 0712004(2022).

[3] Wang J X, Yu Z Q, Hu J B et al. Effect of pulse separation induced by dual-wavelength wave plate on terahertz waves radiation from two-color field[J]. Chinese Journal of Lasers, 48, 0314002(2021).

[4] Pang Y J, Zhang Y X, Yang H D et al. Reduction of the polarization sensitivity of grating-based spectrometer using an achromatic quarter-wave plate[J]. Optics Communications, 393, 139-142(2017).

[5] Peng J G, Yuan S, Jin Z Y et al. Accurate parameter measurement of wave plate based on the dual-beam polarization analyzer configuration[J]. Acta Optica Sinica, 40, 0912002(2020).

[6] Chen K H, Tseng J T, Yeh C H et al. Alternative method for measuring the phase retardation and fast axis of a wave plate[J]. Optical Review, 26, 652-658(2019).

[7] Liu J, You K, Zhao Q L et al. Measuring phase retardation of wave plate based on normalized polarization modulation and error analysis[J]. Optik, 157, 798-803(2018).

[8] Zeng A J, Li F Y, Zhu L L et al. Simultaneous measurement of retardance and fast axis angle of a quarter-wave plate using one photoelastic modulator[J]. Applied Optics, 50, 4347-4352(2011).

[9] Chen X J, Yan L S, Yao X S. Waveplate analyzer using binary magneto-optic rotators[J]. Optics Express, 15, 12989-12994(2007).

[10] Chen K H, Lin C H, Liu P C. An interferometric method for simultaneously determination the phase retardation and fast-axis azimuth angle of a wave plate[J]. Journal of Modern Optics, 67, 992-997(2020).

[11] Bakhouche B, Beniaiche A, Guessas H. Novel method for determining the fast axis and phase retardation of a wave plate using Fresnel Rhomb[J]. Journal of Modern Optics, 64, 238-243(2017).

[12] Hou J F, Yu J, Wang D G et al. Phase retardation measurement of wave plates based on the self-calibration method[J]. Chinese Journal of Lasers, 39, 0408007(2012).

[13] Wang W. Determining the retardation of a wave plate by using spectroscopic method[J]. Optics Communications, 285, 4850-4855(2012).

[14] Xie C K, Zeng A J, Huang H J et al. Real-time measurement of retardation and fast axis azimuth for wave plates[J]. Journal of Optical Technology, 82, 294-297(2015).

[15] Zhang P, Liu N, Zhao S J et al. Measurement method for optical retardation based on the phase difference effect of laser feedback fringes[J]. Applied Optics, 54, 204-209(2015).

[16] Liu W X, Liu M, Zhang S L. Method for the measurement of phase retardation of any wave plate with high precision[J]. Applied Optics, 47, 5562-5569(2008).

[17] Gu H G, Chen X G, Zhang C W et al. Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer[J]. Journal of Optics, 20, 015401(2018).

[18] Liang Q T. Jones matrix of the polarizing device[J]. Optical Instruments, 10, 1-9(1988).

[19] Lin D J, Yan J Q, Chao Z X et al. Phasemeter with external trigger applied to PZT-modulated interferometer[J]. International Journal of Electronics, 89, 759-769(2002).

[20] Gu H G, Chen X G, Jiang H et al. Accurate alignment of optical axes of a biplate using a spectroscopic Mueller matrix ellipsometer[J]. Applied Optics, 55, 3935-3941(2016).

[21] Lin D J, Jiang H, Yin C Y. Analysis of nonlinearity in a high-resolution grating interferometer[J]. Optics & Laser Technology, 32, 95-99(2000).

[22] Chen Q H, Liu B C, He Y X et al. Phase retardation measurement of an arbitrary wave plate based on magneto-optical modulating and residue detecting of the base frequency component of the signal[J]. Optics Letters, 43, 4514-4517(2018).