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Infrared and Laser Engineering, Volume. 45, Issue 5, 504004(2016)

Discussion of reliability analysis on IRFPAs by bad pixel

Hao Lichao1,*... Huang Aibo2, Lai Canxiong1, Chen Xing2, Chen Hui1, Hao Mingming1, Lu Guoguang1, Huang Yun1 and En Yunfei1 |Show fewer author(s)
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    Hao Lichao, Huang Aibo, Lai Canxiong, Chen Xing, Chen Hui, Hao Mingming, Lu Guoguang, Huang Yun, En Yunfei. Discussion of reliability analysis on IRFPAs by bad pixel[J]. Infrared and Laser Engineering, 2016, 45(5): 504004

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    Paper Information

    Category: 红外技术及应用

    Received: Sep. 5, 2015

    Accepted: Oct. 3, 2015

    Published Online: Jun. 12, 2016

    The Author Email: Lichao Hao (hao_li_chao@163.com)

    DOI:10.3788/irla201645.0504004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology