Photonics Research, Volume. 10, Issue 3, 758(2022)
Fast and robust phase retrieval for masked coherent diffractive imaging
Fig. 1. Typical masked CDI:
Fig. 2. Imaging results of the Pb growth experiment (amplitude reconstructions). (a)–(f), (m)–(r) ADMM phase retrieval results for No. 1–12 diffraction patterns; (g)–(l), (s)–(x) phase retrieval results for No. 1–12 diffraction patterns using the baseline method, respectively.
Fig. 3. ADMM iterations for the Pb growth experiment (different colors for different diffraction patterns). Both converge quickly. (a) Error. (b)
Fig. 4. Reconstructed object planes for No. 1 diffraction pattern. The main difference is the area outside the support. (a) ADMM. (b) Baseline.
Fig. 5. Imaging results of No. 1 diffraction pattern in the Pb growth experiment (amplitude reconstructions) using different phase retrieval methods. (a) Baseline. (b) ADMM. (c) WF. (d) TWF.
Fig. 6. ADMM iterations for the glioblastoma experiment (different colors for different diffraction patterns). (a) Error. (b)
Fig. 7. Imaging results of the glioblastoma experiment (phase reconstructions). (a)–(f), (m)–(r) ADMM phase retrieval results for No. 1–12 diffraction patterns; (g)–(l), (s)–(x) phase retrieval results for No. 1–12 diffraction patterns using the baseline method, respectively.
Fig. 8. Processing time in different experiments (unit: s). (a) Pb growth experiment. (b) Glioblastoma experiment.
Fig. 9. Phase retrieval results with single diffraction pattern. (a), (b) Baseline method and ADMM method for No. 10 diffraction pattern in the Pb growth experiment; (c), (d) baseline method and ADMM method for No. 7 diffraction pattern in the glioblastoma experiment, respectively.
|
|
|
|
|
Get Citation
Copy Citation Text
Li Song, Edmund Y. Lam. Fast and robust phase retrieval for masked coherent diffractive imaging[J]. Photonics Research, 2022, 10(3): 758
Category: Image Processing and Image Analysis
Received: Nov. 9, 2021
Accepted: Jan. 20, 2022
Published Online: Mar. 1, 2022
The Author Email: Edmund Y. Lam (elam@eee.hku.hk)