Laser & Optoelectronics Progress, Volume. 52, Issue 5, 53101(2015)
Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments
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Ling Xiulan, Wang Gao, Liu Xiaofeng. Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments[J]. Laser & Optoelectronics Progress, 2015, 52(5): 53101
Paper Information
Category: Thin Films
Received: Dec. 8, 2014
Accepted: --
Published Online: Apr. 20, 2015
The Author Email: Xiulan Ling (nmlxlmiao@126.com)
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