Opto-Electronic Engineering, Volume. 33, Issue 1, 116(2006)

Profilometry for phase measurement with non-integral twin-frequency grating

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    References(5)

    [1] [1] Frank CHEN,Gordon M BROWN,Munin SONG.Overview of three-dimensional shape measurement using optical methods[J].Opt.Eng,2000,39(1):10-22.

    [3] [3] Jielin LI,HongJun SU,Xianyu SU.Two-frequency grating used in phase-measuring profilometry[J].Applied Optics,1997,36(1):277-280.

    [5] [5] J.M.HUNTLEY,H.SALDNER.Temporal phase-unwrapping algorithm for automated interferogram analysis[J].Applied Optics,1993,32(17):3047-3052.

    [6] [6] V.I.GUSHOV,Yu.N.SOLODKIN.Automatic processing of fringe patterns in integer interferometers[J].Opt.Lasers Eng,1991,14(4-5):311-324.

    [7] [7] Yasuyuki IKEDA,Satoru YONEYAMA,Motoharu FUJIGAKI,et al.Absolute phase analysis method for three-dimensional surface profilometry using frequency-modulated grating[J].Opt.Eng,2003,42(5):1249-1256.

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    [in Chinese], [in Chinese], [in Chinese]. Profilometry for phase measurement with non-integral twin-frequency grating[J]. Opto-Electronic Engineering, 2006, 33(1): 116

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    Paper Information

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    Received: Jul. 18, 2005

    Accepted: --

    Published Online: Nov. 14, 2007

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