Development of terahertz detectors with low dimensional materials (<i>Invited</i>)

Zhaoguo Liu; Huanli Zhou; Weidi He; Ning Zhao; Tong Zhang

doi:10.3788/IRLA20211015

Infrared and Laser Engineering, Volume. 50, Issue 1, 20211015(2021)

Development of terahertz detectors with low dimensional materials (Invited)

Zhaoguo Liu, Huanli Zhou, Weidi He, Ning Zhao, and Tong Zhang

Joint International Research Laboratory of Information Display and Visualization, School of Electronics Science and Engineering, Southeast University, Nanjing 210096, China

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Fig. 1. [in Chinese]

Fig. 2. [in Chinese]

Fig. 3. [in Chinese]

Fig. 4. [in Chinese]

Fig. 5. [in Chinese]

Table 1. [in Chinese]

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Table 1. [in Chinese]

Mechanism	Material	Frequency	Responsivity	Response time	NEP	Ref.
Bolometer	Graphene	2 THz	8 nA/W	50 ps	−	[22]
Bolometer	Graphene	0.15 THz	1×10¹⁰ V/W	<2.5 ns	0.2 fW/Hz^1/2	[23]
Bolometer	BP	0.3 THz	7.8 V/W	<1 ms	4 nW/Hz^1/2	[25]
PTE	Graphene	2.52 THz	>10 V/W	110 ps	1.1 nW/Hz^1/2	[29]
PTE	Graphene	2.52 THz	8.4 mV/W	5 μs	−	[30]
PTE	BP	0.3 THz	0.9 mV/W	20 ps	−	[31]
Plasma wave rectification	MoSe₂	0.29 THz	38 mV/W	−	6.6×10^-6 W/Hz^1/2	[36]
Plasma wave rectification	Graphene	0.6 THz	14 V/W	<30 μs	515 pW/Hz^1/2	[37]
Plasma wave rectification	Graphene	0.3 THz	1.2 V/W	<2.5 ms	2 nW/Hz^1/2	[38]
Plasma wave rectification	BP	0.26-0.38 THz	0.15 V/W	−	40 nW/Hz^1/2	[39]
Plasma wave rectification	Graphene	0.23-0.375 THz	0.25 V/W	<1.2 ms	80 nW/Hz^1/2	[42]
Hot carrier-assisted	Bi₂Se₃	0.3 THz	>10 V/W	60 μs	0.36 pW/Hz^1/2	[46]
Hot carrier-assisted	BP	0.15 THz	300 V/W	4 μs	1 nW/Hz^1/2	[47]
Hot carrier-assisted	TaSe₂	0.3 THz	40 A/W	−	<1 pW/Hz^1/2	[48]

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Zhaoguo Liu, Huanli Zhou, Weidi He, Ning Zhao, Tong Zhang. Development of terahertz detectors with low dimensional materials (Invited)[J]. Infrared and Laser Engineering, 2021, 50(1): 20211015

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Paper Information

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Received: Nov. 20, 2020

Accepted: --

Published Online: Mar. 24, 2021

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DOI:10.3788/IRLA20211015

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology