[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Opto-Electronic Engineering, Volume. 32, Issue 3, 20(2005)

[in Chinese]

[in Chinese]1...2, [in Chinese]1, [in Chinese]1, [in Chinese]1 and [in Chinese]1 |Show fewer author(s)

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References(4)

[2] [2] MAURO Melozzi,LUCA Pezzati,Alessandro Mazzoni.Testing aspheric surfaces using mulitiple annular interferograms[J].Opt.Eng,1993,32(5):1073-1079.

[3] [3] MAHAJAN V N. Zernike annular polynomials for imaging systems with annular pupils[J].J.Opt.Soc.Am,1981,71(1):75-85.

[4] [4] LIU Ying-moh,GEORGE N Lawrence,CHRIST L Kolipoulos. Subaperture testing of aspheres with annular zones[J]. Appl.Opt,1988,27(21):4504-4513.

[5] [5] STEPHEN C J,WENG W C,GEORGE N L. Subaperture--testing--approaches:a--comparison[J].Appl.Opt,1984,23(5):740-745.

CLP Journals

[1] WANG Li-hua, WU Shi-bin, HOU Xi, KUANG Long, CAO Xue-dong. Measurement of Flat Wavefront by Sub-aperture Stitching Interferometry[J]. Opto-Electronic Engineering, 2009, 36(6): 126

[2] Zhang Lei, Tian Chao, Liu Dong, Shi Tu, Yang Yongying, Shen Yibing. Non-Null Annular Subaperture Stitching Interferometry for Aspheric Test[J]. Acta Optica Sinica, 2014, 34(8): 812003

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Paper Information

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Received: Jul. 15, 2004

Accepted: --

Published Online: Nov. 14, 2007

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Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

CLP Journals

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