[1] [1] G. Coppolar, P. Ferraro, M. Iodice et al.. A digital holographic microscope complete characterization of microelectromechanical system ［J］. Meas. Sci. Technol., 2004, 15(3): 529～539

[2] [2] L. Salbut, M. Kujawinska. Optical measurement station for complex testing of microelement ［J］. Opt. Lasers Engng., 2001, 36(2): 225～240

[3] [3] S. H. Wang, C. Quan, C. J. Tay et al.. Deformation measurement of MEMS components using optical interferometry ［J］. Meas. Sci. Technol., 2003, 14(3): 909～915

[4] [4] Wang Wei, He Xiaoyuan. Application of optical extensometer on the real-strain measurement of low-dimensional materials ［J］. Acta Optica Sinica, 2010, 30(6): 1662～1666

[5] [5] M. Takeda, H. Ina, S. Kobayashi. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry ［J］. J. Opt. Soc. Am., 1982, 72(1): 156～160

[6] [6] Q. Kemao. Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications and implementations ［J］. Opt. Lasers Engng., 2007, 45(2): 304～317

[7] [7] Li Sikun, Su Xianyu, Chen Wenjing. Application of two-dimensional wavelet transform on phase analysis of spatial carrier-fringe patterns ［J］. Acta Optica Sinica, 2010, 30(6): 1673～1679

[8] [8] Li Kai, Zhang Dazhi, Wang Jingjing et al.. Phase extraction of an ESPI fringe pattern by using two-dimensional continuous wavelet transform ［J］. Acta Optica Sinica, 2010, 30(3): 733～738

[9] [9] Huang Yu, Zhong Jingang. Improved algorithm to choose the window scale for windowed Fourier transform profilometry ［J］. Optical Technique, 2010, 36(3): 378～385

[10] [10] J. M. Huntley, G. H. Kaufmann, D. Kerr. Phase-shifted dynamic speckle pattern interferometry at 1 kHz ［J］. Appl. Opt., 1999, 38(31): 6556～6563

[11] [11] J. M. Huntley, H. Saldner. Temporal phase-unwrapping algorithm for automated interferogram analysis ［J］. Appl. Opt., 1993, 32(17): 3047～3052

[12] [12] Li Xide, Tao Gang, Deng Bing et al.. Time-sequence speckle metrology and its applications ［J］. Acta Photonica Sinica, 2002, 31(8): 993～997

[13] [13] Y. Fu, C. J. Tay, C. Quan et al.. Wavelet analysis of speckle patterns with a temporal carrier ［J］. Appl. Opt., 2005, 44(6): 959～965

[14] [14] Chen Fanxiu, He Xiaoyuan. Instantaneous three-dimemsional profile measurement based on temporal wavelet transform ［J］. Acta Optica Sinica, 2007, 26(12): 1803～1805

[15] [15] D. M. Meadows, W. O. Johnson, J. B. Allen. Generation of surface contours by moiré patterns ［J］. Appl. Opt., 1970, 9(4): 942～947

[16] [16] H. Takasaki. Moiré topography ［J］. Appl. Opt., 1970, 9(6): 1467～1472

[17] [17] L. H. Jin, Y. Kodera, T. Yoshizawa et al.. Shadow moire profilometry using the phase-shifting method ［J］. Opt. Engng., 2000, 39(8): 2119～2123

[18] [18] K. S. Lee, C. J. Tang, H. C. Chen et al.. Measurement of stress in aluminum film coated on a flexible substrate by the shadow moire method［J］. Appl. Opt., 2008, 47(13): C315～C318

[19] [19] Y. Y. Hung, C. Y. Liang, J. D. Hovanesian et al.. Time-averaged shadow-moiré method for studying vibrations ［J］. Appl. Opt., 1977, 16(6): 1717～1719

[20] [20] J. Fujimoto. Determination of the vibration phase by a time-averaged shadow moiré method ［J］. Appl. Opt., 1982, 21(23): 4373～4376

[21] [21] L. H. Jin, Y. Otani, T. Yoshizawa. Shadow moiré profilometry by frequency sweeping ［J］. Opt. Engng., 2001, 40(7): 1383～1386

[22] [22] C. J. Tay, C. Quan, Y. Fu et al.. Instantaneous velocity displacement and contour measurement by use of shadow moiré and temporal wavelet analysis［J］. Appl. Opt., 2004, 43(21): 4164～4171

[23] [23] M. Takeda, M. Kitoh. Spatiotemporal frequency multiplex heterodyne interferometry ［J］. J. Opt. Soc. Am. A, 1992, 9(9): 1607～1614

[24] [24] K. Qian, Y. Fu, Q. Liu et al.. Generalized three-dimensional windowed Fourier transform for fringe analysis ［J］. Opt. Lett., 2006, 31(14): 2121～2123