Laser & Optoelectronics Progress, Volume. 62, Issue 6, 0612001(2025)

Accurate Robust Extraction Method for Elliptical Inner Diameter of Local Highlight Flange

Binbin Du* and Changjie Liu
Author Affiliations
  • State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
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    Figures & Tables(12)
    Flow chart of flange inner diameter ellipse extraction method
    Framework of YOLOv4 network
    Schematic diagram of arc segmentation
    Model diagram of adaptive threshold for circular arcs
    Schematic diagram of arc extraction
    Effect of AAMED method for arc extraction
    Schematic diagram of filtering area
    Model diagram of light stripe noise
    Comparison diagram of unloading flange positioning before and after. (a) Original image; (b) YOLO positioning image
    Comparison results of flange contour extraction accuracy. (a) Diagram of discharge flange with presence of light strip noise; (b) local magnification effect; (c) AAMED method; (d) after a single screening; (e) after secondary screening; (f) after removing outliers and secondary screening
    Robustness test results for flange contour extraction. (a) Original image; (b) extract results; (c) right partial view; (d) left partial view
    • Table 1. Comparison measurement results of flange center coordinates under different postures

      View table

      Table 1. Comparison measurement results of flange center coordinates under different postures

      PostureMonocular camera measurement results /mmTotal station measurement results /mmError /mm
      1(789.58, 8.36, -68.45)(788.99, 8.73, -67.47)1.20
      2(714.37, 8.05, -66.42)(715.26, 7.57, -65.30)1.51
      3(740.99, -5.64, -24.99)(740.04, -4.69, -25.21)1.36
      4(757.83, 9.64, -11.66)(756.44, 9.98, -10.36)1.93
      5(735.11, 10.25, -54.54)(736.41, 9.89, -53.66)1.61
      6(734.61, -4.48, 8.44)(733.67, -4.18, 9.34)1.33
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    Binbin Du, Changjie Liu. Accurate Robust Extraction Method for Elliptical Inner Diameter of Local Highlight Flange[J]. Laser & Optoelectronics Progress, 2025, 62(6): 0612001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 15, 2024

    Accepted: Aug. 20, 2024

    Published Online: Mar. 17, 2025

    The Author Email:

    DOI:10.3788/LOP241682

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