Acta Photonica Sinica, Volume. 52, Issue 12, 1212003(2023)

High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop

Lu YE1...2, Xiangchao ZHANG1,*, Junhua WANG1, Min XU1 and Liehua ZHENG2 |Show fewer author(s)
Author Affiliations
  • 1Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing,Fudan University,Shanghai 200438,China
  • 2Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
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    Figures & Tables(15)
    Diagram of deflectometric measurement
    Camera lens layout
    Camera lens standard spot diagram
    Camera lens distortion
    Camera structure model diagram
    Calibration diagram of rays
    The calculating process of reflected rays and measured points
    Coordinates of off-axis aspheric surface
    Experimental setup
    Calibration of screen pixel coordinates
    Calibration of reflected light direction
    Reconstruction results
    Comparison of different measurement methods
    Comparison of reconstruction results of off-axis paraboloid
    • Table 1. Camera specification list

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      Table 1. Camera specification list

      ItemsProperties
      Camera modelManta G 1 236 B
      SensorCMOS
      Camera resolution4 112×3 008
      Pixel size3.45 μm×3.45 μm
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    Lu YE, Xiangchao ZHANG, Junhua WANG, Min XU, Liehua ZHENG. High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop[J]. Acta Photonica Sinica, 2023, 52(12): 1212003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 14, 2023

    Accepted: Aug. 1, 2023

    Published Online: Feb. 19, 2024

    The Author Email: ZHANG Xiangchao (zxchao@fudan.edu.cn)

    DOI:10.3788/gzxb20235212.1212003

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