Acta Photonica Sinica, Volume. 52, Issue 12, 1212003(2023)
High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop
Fig. 7. The calculating process of reflected rays and measured points
Fig. 14. Comparison of reconstruction results of off-axis paraboloid
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Lu YE, Xiangchao ZHANG, Junhua WANG, Min XU, Liehua ZHENG. High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop[J]. Acta Photonica Sinica, 2023, 52(12): 1212003
Category: Instrumentation, Measurement and Metrology
Received: Jun. 14, 2023
Accepted: Aug. 1, 2023
Published Online: Feb. 19, 2024
The Author Email: ZHANG Xiangchao (zxchao@fudan.edu.cn)