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Semiconductor Optoelectronics, Volume. 43, Issue 5, 839(2022)

Simulation Research Progress of Radiation Damage Effects on CMOS Image Sensors

WANG Zujun1...2, LAI Shankun2, YANG Xie3, JIA Tongxuan2, HUANG Gang2 and NIE Xu2 |Show fewer author(s)
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    WANG Zujun, LAI Shankun, YANG Xie, JIA Tongxuan, HUANG Gang, NIE Xu. Simulation Research Progress of Radiation Damage Effects on CMOS Image Sensors[J]. Semiconductor Optoelectronics, 2022, 43(5): 839

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    Received: Apr. 15, 2022

    Accepted: --

    Published Online: Jan. 27, 2023

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2022041502

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology