Acta Optica Sinica, Volume. 12, Issue 1, 78(1992)
Surface roughness study of light-emitting tunnel junction with scanning tunnelling microscope
We report a study of the surface of Al-Al2O3-Au light-emitting junctions deposited on CaF2 underlayers of 100 nm thickness with scanning tunnelling micos-copy (STM) in air. For the first time, two kinds of the noughness on the junction surface are obserned, which have the transverse correlation length of 30-70nm and 3-5nm, respectively. The smaller one is modulated by the larger one. The existanoe of this surface roughness with the transverse correlation length of 3-5 nm is in agreement with the theoretical predication of Lake and Mills
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[in Chinese], [in Chinese]. Surface roughness study of light-emitting tunnel junction with scanning tunnelling microscope[J]. Acta Optica Sinica, 1992, 12(1): 78