Optics and Precision Engineering, Volume. 32, Issue 17, 2654(2024)

Perpendicularity measurement of multi-axis motion platform based on laser interferometry

Kaiyuan LUO, Wenwei ZHENG, and Lin YANG*
Author Affiliations
  • Calibration and Testing Center, the Fifth Electronic Research Institute of MIIT,Guangzhou511370, China
  • show less

    Perpendicularity error is a critical geometric error in multi-axis motion platforms, indicating the vertical deviation of machine tool components during movement. This deviation significantly affects spatial positioning errors, particularly as the stroke length of the moving axis increases. Various methods exist for measuring perpendicularity error, including physical gauges, volumetric measurements, CCD measurements, planar gratings, laser trackers, and laser interferometry. However, these methods often suffer from drawbacks such as operational inconvenience, high costs, or inability to perform online measurements. This paper presents a multi-axis laser interferometric device for measuring perpendicularity, utilizing components like laser emitters, pentagonal beam splitters, prisms, straightness interferometers, and reflectors. With a well-designed optical path, this device can be integrated into the multi-axis motion platform, enabling efficient and precise online measurement of perpendicularity. A comparison test against a granite protractor showed a deviation of 1.4″ and a normalized deviation En<1, confirming the method's feasibility and accuracy.

    Keywords
    Tools

    Get Citation

    Copy Citation Text

    Kaiyuan LUO, Wenwei ZHENG, Lin YANG. Perpendicularity measurement of multi-axis motion platform based on laser interferometry[J]. Optics and Precision Engineering, 2024, 32(17): 2654

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Precision Measurement and Sensing

    Received: Mar. 13, 2024

    Accepted: --

    Published Online: Nov. 18, 2024

    The Author Email: YANG Lin (yanglin@ceprei.com)

    DOI:10.37188/OPE.20243217.2654

    Topics