Laser & Optoelectronics Progress, Volume. 53, Issue 8, 81408(2016)

Thermocouple Time Constant Test System and Uncertainty Analysis Based on Semiconductor Lasers

Hao Xiaojian*, Zhang Genfu, and Zan Qingbo
Author Affiliations
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    References(10)

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    CLP Journals

    [1] Hu Xiaotao, Hao Xiaojian, Duan Xianggang. Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra[J]. Laser & Optoelectronics Progress, 2017, 54(10): 100201

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    Hao Xiaojian, Zhang Genfu, Zan Qingbo. Thermocouple Time Constant Test System and Uncertainty Analysis Based on Semiconductor Lasers[J]. Laser & Optoelectronics Progress, 2016, 53(8): 81408

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Apr. 25, 2016

    Accepted: --

    Published Online: Aug. 11, 2016

    The Author Email: Xiaojian Hao (zhang__gf@163.com)

    DOI:10.3788/lop53.081408

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