Optics and Precision Engineering, Volume. 20, Issue 3, 550(2012)

Piezoresistive pressure sensors for harsh environments

SAN Hai-sheng1...2,*, SONG Zi-jun1, WANG Xiang1, ZHAO Yan-li1 and YU Yu-xi3 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(10)

    [1] [1] WANG H L,SONG J,FENG D Q, et al.. High temperature-pressure FBG sensor applied to special environments [J]. Opt. Precision Eng., 2011,19(3): 545-550. (in Chinese)

    [3] [3] GUAN R F. Research on the reliability of MEMS oil pressure sensor [J]. Micronano Electronic Technology, 2007, 7(8):176-202.(in Chinese)

    [4] [4] TSUNG L C, CHEN H C, CHUN T L, et al.. Sensitivity analysis of packaging effect of silicon-based piezoresistive pressure sensor [J]. Sensors and Actuators A: Physical, 2009, 152(1): 29-38.

    [5] [5] LIN H, STEVENSON J T M, GUNDLACH A M, et al.. Direct Al-Al contact using low temperature wafer bonding for integrating MEMS and CMOS devices[J]. Microelectronic Engineering, 2008, 85(5-6):1059-1061.

    [6] [6] YOZO K, AKIO Y. Optimum design considerations for silicon piezoresistive pressure sensors [J]. Sensors and Actuators A: Physical, 1997, 62:539-542.

    [7] [7] LIN L W, HUEY C C, YEN W L. A Simulation Program for the Sensitivity and Linearity of Piezoresistive Pressure Sensors [J]. Journal of Micro Electromechanical Systems, 1999, 8(4):514-522.

    [8] [8] HERMANN S, KARL K. A square-diaphragm piezoresistive pressure sensor with a rectangular central boss for low-pressure ranges [J]. IEEE Transactions on Electron Devices, 1993, 40(10):1754-1759.

    [9] [9] XIU X W. Investigation of negative resistance in ga-diffusion transistor [D] Shandong: Shandong Normal University, 2003.(in Chinese)

    [10] [10] ALVIN B, WOO T P, JOSEPH R M, et al.. Review: semiconductor piezoresistance for microsystems [J]. Proceedings of the IEEE, 2009, 97(3):513-552.

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    SAN Hai-sheng, SONG Zi-jun, WANG Xiang, ZHAO Yan-li, YU Yu-xi. Piezoresistive pressure sensors for harsh environments[J]. Optics and Precision Engineering, 2012, 20(3): 550

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    Paper Information

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    Received: Oct. 21, 2011

    Accepted: --

    Published Online: Apr. 16, 2012

    The Author Email: Hai-sheng SAN (sanhs@xmu.edu.cn)

    DOI:10.3788/ope.20122003.0550

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