Electro-Optic Technology Application, Volume. 33, Issue 4, 53(2018)
Application Research on Multi-resolution Modeling in Electro-optical Information Simulation System
References(1)
[9] [9] Kornman B D, Marion P B. Cross-model consistency in JSIMS[R]. Technical Report Lockheed Martin Information Systems Advanced Simulation Laboratory, Norfolk Virginia, 1998.
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KONG Xiao-ling, CHEN Hai-xia. Application Research on Multi-resolution Modeling in Electro-optical Information Simulation System[J]. Electro-Optic Technology Application, 2018, 33(4): 53
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