Acta Optica Sinica, Volume. 30, Issue 2, 461(2010)

Study on Lateral Distribution of Working Wavelength and Packaging-Induced-Stress in Laser Diode Array

Shen Li*, Xin Guofeng, Pi Haoyang, Fang Zujie, Chen Gaoting, and Qu Ronghui
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    References(10)

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    CLP Journals

    [1] Xin Guofeng, Shen Li, Pi Haoyang, Qu Ronghui, Cai Haiwen, Fang Zujie, Chen Gaoting. Experimental Study of Thermal Resistance Measurement for High Power Laser Diode Array[J]. Laser & Optoelectronics Progress, 2010, 47(11): 112501

    [2] Zhang Zhijun, Liu Yun, Fu Xihong, Shan Xiaonan, Zhu Hongbo, Wang Lijun. Analysis on Overall Thermal Resistance of Laser Diode Beam Combined Modules[J]. Chinese Journal of Lasers, 2012, 39(4): 402010

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    Shen Li, Xin Guofeng, Pi Haoyang, Fang Zujie, Chen Gaoting, Qu Ronghui. Study on Lateral Distribution of Working Wavelength and Packaging-Induced-Stress in Laser Diode Array[J]. Acta Optica Sinica, 2010, 30(2): 461

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Mar. 26, 2009

    Accepted: --

    Published Online: Feb. 2, 2010

    The Author Email: Li Shen (shenli621@126.com)

    DOI:10.3788/aos20103002.0461

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