Semiconductor Optoelectronics, Volume. 42, Issue 1, 25(2021)

An Interline CCD Image Sensor with Open Window Ability

YANG Hong, Li Jin, BAI Xueping, REN Siwei, YUAN Shishun, and WENG Xuetao
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    References(10)

    [1] [1] Ishihara Y, Oda E, Tanigawa H, et al. Interline CCD image sensor with an antiblooming structure[R]. ISSCC Dig. Tech. Papers, 1982: 168-169.

    [2] [2] Loseeetal D L. A 1/3 format image sensor with refractory metal light shield for color video applications[R]. ISSCC Dig.Tech. Papers, 1989: 90-91.

    [3] [3] Teranishi N, et al. No image lag photodiode structure in the interline CCD image sensor[R]. IEDM Tech. Dig., 1982: 324-327.

    [4] [4] Haradaeta! K. A 213-inch 2Mpixel FIT-CCD HDTV image sensor[R]. ISSCC Dig. Tech. Papers, 1992: 170-17I.

    [5] [5] Hosack H H, Hynecek J. Clock controlled anti-blooming for virtual phase CCDs: US, EP19820300746[P]. 1985-02-15.

    [6] [6] Furukawa A, Matsunaga Y, Suzuki N, et al. An interline transfer CCD for single sensor 2/3″ color camera[R]. IEDM Tech. Dig., 1980: 346-349.

    [7] [7] Oda E, Ishihara Y, Teranishi N. Blooming suppression mechanism for an interline CCD image sensor with a vertical overflow drain[R]. IEDM Tech. Dig., 1983: 501-504.

    [8] [8] Akiyama I, Kohno A, Teranishi N. Noise characteristics of an interline CCD image sensor[C]// Proc. Conf.: TV SOC. Japan, 1983: 57-58.

    [11] [11] Albert J P Theuwissen. Solid-State Imaging with CCDs[M]. Kluwer Academic Publishers, 1995.

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    YANG Hong, Li Jin, BAI Xueping, REN Siwei, YUAN Shishun, WENG Xuetao. An Interline CCD Image Sensor with Open Window Ability[J]. Semiconductor Optoelectronics, 2021, 42(1): 25

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    Paper Information

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    Received: Nov. 6, 2020

    Accepted: --

    Published Online: Mar. 18, 2021

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2021.01.004

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