Chinese Journal of Lasers, Volume. 35, Issue 5, 760(2008)
Analysis for Accurately Fitting the Refractive Index of SiO2 Thin Film
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Wang Yanzhi, Zhang Weili, Fan Zhengxiu, Huang Jianbin, Jin Yunxia, Yao Jianke, Shao Jianda. Analysis for Accurately Fitting the Refractive Index of SiO2 Thin Film[J]. Chinese Journal of Lasers, 2008, 35(5): 760
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