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Laser & Optoelectronics Progress, Volume. 53, Issue 10, 103101(2016)

Spectral Ellipsometry of Dielectric/Metal/Dielectric Transparent Conductive Multi-Layer Films

Sun Yao1,2,3、* and Wang Hong1,2,3
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    Sun Yao, Wang Hong. Spectral Ellipsometry of Dielectric/Metal/Dielectric Transparent Conductive Multi-Layer Films[J]. Laser & Optoelectronics Progress, 2016, 53(10): 103101

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    Paper Information

    Category: Thin Films

    Received: Jun. 8, 2016

    Accepted: --

    Published Online: Oct. 12, 2016

    The Author Email: Yao Sun (sunyao119@163.com)

    DOI:10.3788/lop53.103101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology