Acta Optica Sinica, Volume. 41, Issue 10, 1011001(2021)

Aberration Correction of Fourier Ptychographic Microscopy Based on Ptychographical Iterative Engine

Jinhua Zhang1,2, Jizhou Zhang1,2、*, Jianan Li1、**, Jie Li3、***, Yiwen Chen1,2, Xin Wang1,2, Shushan Wang1,2, and Tingfa Xu1,2
Author Affiliations
  • 1Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2Chongqing Innovation Center, Beijing Institute of Technology, Chongqing 401120, China
  • 3Electronic Information Engineering College, Changchun University, Changchun, Jilin 130022, China
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    References(16)

    [4] Rodenburg J M. Faulkner H M L. A phase retrieval algorithm for shifting illumination[J]. Applied Physics Letters, 85, 4795-4797(2004).

    [6] Gerchberg R W, Saxton W O. Phase determination for image and diffraction plane pictures in the electron microscope[J]. Optik - International Journal for Light and Electron Optics, 34, 275-284(1971).

    [14] Sun M L, Chen X, Zhu Y Q et al. Neural network model combined with pupil recovery for Fourier ptychographic microscopy[J]. Optics Express, 27, 24161-24174(2019).

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    Jinhua Zhang, Jizhou Zhang, Jianan Li, Jie Li, Yiwen Chen, Xin Wang, Shushan Wang, Tingfa Xu. Aberration Correction of Fourier Ptychographic Microscopy Based on Ptychographical Iterative Engine[J]. Acta Optica Sinica, 2021, 41(10): 1011001

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    Paper Information

    Category: Imaging Systems

    Received: Nov. 11, 2020

    Accepted: Dec. 14, 2020

    Published Online: May. 8, 2021

    The Author Email: Zhang Jizhou (2120140578@bit.edu.cn), Li Jianan (20090964@bit.edu.cn), Li Jie (Leejie1994y@126.com)

    DOI:10.3788/AOS202141.1011001

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