Opto-Electronic Engineering, Volume. 32, Issue 12, 21(2005)

Comparison between double exposure with two laser beams interference and single exposure with four laser beams

[in Chinese]1...2, [in Chinese]1 and [in Chinese]2 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    References(2)

    [1] [1] Carl O.BOZLER,Christopher T.HARRIS,Steven RABE,et al.Arrays of gated field-emitter cones having 0.32μm tip-to tip spacing[J].Journal of Vacuum Science & Technology B:Microelectronics and Nanometer Structures,1994,12(2):629-632.

    [2] [2] J.P.SPALLAS,R.D.BOYD,J.A.BRITTEN,et al.Fabrication of sub-0.5μm diameter cobalt dots on silicon substrates and photoresist pedestals on 50cm×50cm glass substrates using laser interference lithography[J].Journal of Vacuum Science & Technology B:Microelectronics and Nanometer Structures,1996,14(3):2005-2007.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese]. Comparison between double exposure with two laser beams interference and single exposure with four laser beams[J]. Opto-Electronic Engineering, 2005, 32(12): 21

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Jul. 13, 2005

    Accepted: --

    Published Online: Nov. 14, 2007

    The Author Email:

    DOI:

    Topics