Optoelectronics Letters, Volume. 10, Issue 4, 308(2014)

A color phase shift profilometry for the fabric defect detection

Li-mei SONG1,*... Zong-yan LI1, Yu-lan CHANG1, Guang-xin XING1, Peng-qiang WANG1, Jiang-tao XI2 and Teng-da ZHU1 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin 300387, China
  • 2School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Keiraville 2500, Australia
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    SONG Li-mei, LI Zong-yan, CHANG Yu-lan, XING Guang-xin, WANG Peng-qiang, XI Jiang-tao, ZHU Teng-da. A color phase shift profilometry for the fabric defect detection[J]. Optoelectronics Letters, 2014, 10(4): 308

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    Paper Information

    Received: Apr. 18, 2014

    Accepted: --

    Published Online: Oct. 12, 2017

    The Author Email: Li-mei SONG (lilymay1976@126.com)

    DOI:10.1007/s11801-014-4065-z

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