Chinese Optics Letters, Volume. 14, Issue 4, 042401(2016)

Influence of surface roughness on surface plasmon resonance phenomenon of gold film

Zhitao Yang1,2、*, Changjian Liu2, Yachen Gao1,3、**, Jiyu Wang2, and Wenlong Yang2
Author Affiliations
  • 1Postdoctoral Mobile Research Station of the School of Electronic Engineering, Heilongjiang University, Harbin 150080, China
  • 2School of Applied Sciences, Harbin University of Science and Technology, Harbin 150080, China
  • 3Key Laboratory of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080, China
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    Figures & Tables(6)
    Configuration of the angle-modulation SPR measurement.
    Reflection Intensity of small-angle x ray scattering from the gold film.
    Surface morphology images of samples detected by AFM.
    SPR measurement of samples with different surface roughness.
    Data of resonance angle versus RMS-roughness and the results of the fitting.
    • Table 1. Results of Surface RMS-Roughness and SPR of Samples

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      Table 1. Results of Surface RMS-Roughness and SPR of Samples

      SampleAnnealing temperature (°C)RMS- roughness (nm)Resonance angle (°)Resonance depth
      11001.26044.040.0976
      22000.90643.940.0935
      33000.70043.750.0947
      44000.41543.650.1160
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    Zhitao Yang, Changjian Liu, Yachen Gao, Jiyu Wang, Wenlong Yang. Influence of surface roughness on surface plasmon resonance phenomenon of gold film[J]. Chinese Optics Letters, 2016, 14(4): 042401

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    Paper Information

    Category: Optics at Surfaces

    Received: Nov. 6, 2015

    Accepted: Jan. 25, 2016

    Published Online: Aug. 6, 2018

    The Author Email: Zhitao Yang (yangzt2012@163.com), Yachen Gao (gaoyachen@sina.com)

    DOI:10.3788/COL201614.042401

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