[1] [1] Mei Lin, Wu Lide, Wang Yuwen. A novel defect evaluation method in infrared NDT based on genetic algorithm［J］. Acta Optica Sinica, 2002, 22(12): 1452～1456

[2] [2] Liu Muhua, Chen Quansheng, Lin Huaiwei. The study of non-destructive measurement of fruit internal qualities using spectral imaging［J］. Acta Optica Sinica, 2007, 27(11): 2042～2046

[3] [3] Li Yaping, Zhang Guangjun, Li Qingbo. Application of O2-PLS in experimental study on non-invasive measurement of blood glucose［J］. Acta Optica Sinica, 2010, 30(3): 854～860

[4] [4] Ming Ying, Jiang Jingjue. Moving object detection of infrared video based on cauchy distribution［J］. Journal of Infrared Millimeter Waves, 2008, 27(1): 65～71

[5] [5] Li Yanhong, Zhao Yuejin, Feng Lichun et al.. Quality evaluation of carbon fiber floor coating with infrared thermal wave nondestructive test［J］. Chinese J. Lasers, 2009, 36(6): 1489～1492

[6] [6] Liu Haitao, Chen Yongping, Liang Pingzhi. Design and fabrication of micro-cantilever uncooled infrared detector［J］. Journal of Infrared Millimeter Waves, 2006, 25(1): 46～49

[7] [7] Zhang Hui, Zhao Baojun, Tang Linbo et al.. Infrared object tracking based on adaptive multi-features integration［J］. Acta Optica Sinica, 2010, 30(5): 1291～1296

[8] [8] Ling Jianguo, Liu Erqi, Liang Haiyan et al.. Infrared target extractionmethod based on kernel density estimation［J］. Journal of Infrared Millimeter Waves, 2006, 25(6): 434～438

[9] [9] Li Xin, Zhao Yigong, Chen Bing. A new approach of small and dim target detection in cloud cluster infrared image based on classification［J］. Acta Optica Sinica, 2009, 29(11): 3036～3042

[10] [10] Zheng H., Kong L., Nahavandi S.. Automatic inspection of metallic surface defects using genetic algorithms［J］. J. Materials Processing Technol., 2002, 125-126(s1): 427～433

[11] [11] Liang R. Y., Ding Y. Q., Zhang X. W. et al.. Copper strip surface defects inspection based on SVM-RBF［A］. Proceedings of Fourth International Conference on Natural Computation［C］. Washington, DC, USA: IEEE Computer Society, 2008. 41～45

[12] [12] Zhong Kehong, Ding Mingyue, Zhou Chengping. Texture defect inspection method using difference statistics feature in wavelet domain［J］. Systems Engineering and Electronics, 2004, 26(5): 660～665

[13] [13] Wang Leiguang, Liu Guoying, Mei Tiancan et al.. A segmentation algorithm for high-resolution remote sensing texture based on spectral and texture information weighting［J］. Acta Optica Sinica, 2009, 29(11): 3010～3017

[14] [14] Zhang X. W., Liang R. Y., Ding Y. Q. et al.. The system of copper strips surface defects inspection based on intelligent fusion［C］. Proceedings of IEEE International Conference on Automation and Logistics Washington, DC, USA: IEEE Computer Society, 2008. 476～480

[15] [15] Li T.. Applying wavelets transform, rough set theory and support vector machine for copper clad laminate defects classification［J］. Expert Systems with Applications, 2009, 36(3P2): 5822～5829

[16] [16] Luo Siwei. Information Processing Theory of Visual Perception［M］. Beijing: Publishing House of Electronics Industry, 2006. 53～57

[17] [17] Arivazhagan S., Ganesan L.. Texture segmentation using wavelet transform［J］. Pattern Recognition Letters, 2003, 24(16): 3197～3203

[18] [18] Tsai D., Hsiao B.. Automatic surface inspection using wavelet reconstruction［J］. Pattern Recognition, 2001, 34(6): 1285～1305

[19] [19] Wang Fengchao, Liu Xingtang, Huang Shucai. Target fusion detection with multi-feature based on fuzzy evidence theory［J］. Acta Optica Sinica, 2010, 30(3): 713～719

[20] [20] Xu Changfa, Li Guokuan. Practical Wavelet Method［M］. Wuhan: Huazhong University of Science and Technology Press, 2001. 166～178

[21] [21] Hotelling H.. Multivariate Quality Control, Illustrated by the Air Testing of Sample Bombsights Techniques of Statistical Analysis［M］. New York: McGraw-Hill, 1947. 111～184

[22] [22] Cristianini N., Shawe-Taylor J. An Introduction to Support Vector Machines and Other Kernel-Based Learning Methods［M］. Li Guozheng, Wang Meng, Zeng Huajun transl. Beijing: Publishing House of Electronic Industry Press, 2005. 82～106