Journal of Synthetic Crystals, Volume. 49, Issue 11, 2178(2020)
Epitaxial Growth and Characterizations of Si1-xGex Alloys on Si Substrate
High quality heteroepitaxy is the key to realize high performance microelectronic devices. In this work, Si1-xGex (0
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YUAN Ziyuan, PAN Rui, XIA Shunji, WEI Lian, YE Jiajia, LI Chen, CHEN Yanfeng, LU Hong. Epitaxial Growth and Characterizations of Si1-xGex Alloys on Si Substrate[J]. Journal of Synthetic Crystals, 2020, 49(11): 2178
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Published Online: Jan. 26, 2021
The Author Email: Ziyuan YUAN (yzy3673759@163.com)
CSTR:32186.14.