Acta Photonica Sinica, Volume. 37, Issue 3, 490(2008)
The Fitting of Optical Constants of Infrared Coating Materials and Application in Broadband Antireflection Coatings
[3] [3] JUNG Y S.Spectroscopic ellipsometry studies on the optical constants of indium tin oxide films deposited under various sputtering conditions[J].Thin Solid Films,2004,467(1-2):36-42.
[4] [4] MISTRIK J.Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry[J].Applied Surface Science,2005,244(1-4):431-434
[6] [6] LI B,ZHANG S Y,XIE P.Improving low-temperature performance of infrared thin-film interference filters utilizing the intrinsic properties of IV-VI narrow-gap semiconductors[J].Opt Express,2004,12 (3):401-404.
[7] [7] LI B,ZHANG S Y,XIE P.Improving low-temperature performance of infrared thin-film interference filters utilizing temperature dependence of refractive index of Pb 1-xGexTe[C].SPIE,2005,5640:587-593.
[8] [8] LI B,JIANG J C,ZHANG S Y.Low-temperature dependence of midinfrared optical constants of lead-germanium-telluride thin film[J].Journal of Applied Physics,2002,91(6):3556-3561.
[9] [9] MACLOAD H A.Thin Film Optical Filters(second edition)[M].Bristol:Adam Hilger Ltd,1986.
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. The Fitting of Optical Constants of Infrared Coating Materials and Application in Broadband Antireflection Coatings[J]. Acta Photonica Sinica, 2008, 37(3): 490