Acta Photonica Sinica, Volume. 47, Issue 5, 512001(2018)
Deflectometry Measurement Based on Line-plane Model
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LI Chen, ZHANG Xu, TU Da-wei. Deflectometry Measurement Based on Line-plane Model[J]. Acta Photonica Sinica, 2018, 47(5): 512001
Paper Information
Received: Nov. 20, 2017
Accepted: --
Published Online: Sep. 7, 2018
The Author Email: Chen LI (lichenhaod@126.com)
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