Acta Optica Sinica, Volume. 42, Issue 8, 0811002(2022)

Imaging Electron Optics of Electrostatic Focusing Concentric Spherical System Part B: Paraxial Lateral Chromatic Aberration and Geometrical Lateral Spherical Aberration

Liwei Zhou*
Author Affiliations
  • School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
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    On the basis of the part A, this paper goes further study the electron optical lateral aberration of axial points of the bi-electrode electrostatic focusing concentric spherical system. It shows that the image diffusion of axial points formed by the electrons emitted from the photocathode in an electron optical system is composed of two parts: the paraxial lateral chromatic aberration and the geometric lateral spherical aberration. This confirms that in the electrostatic focusing concentric spherical system, the second order paraxial lateral chromatic aberration of the cathode lens, that is, the Recknagel-Apцимович formula, is generally valid. This paper also studies the differences of lateral aberrations of axial points between the wide electron beam and the narrow electron beam. Finally, a special case of transit of the proximity focusing system from the bi-electrode electrostatic focusing concentric spherical system is also investigated.

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    Liwei Zhou. Imaging Electron Optics of Electrostatic Focusing Concentric Spherical System Part B: Paraxial Lateral Chromatic Aberration and Geometrical Lateral Spherical Aberration[J]. Acta Optica Sinica, 2022, 42(8): 0811002

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    Paper Information

    Category: Imaging Systems

    Received: Oct. 26, 2021

    Accepted: Nov. 15, 2021

    Published Online: Mar. 30, 2022

    The Author Email: Zhou Liwei (zhoulw@vip.sina.com)

    DOI:10.3788/AOS202242.0811002

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