Determination of High-Temperature Refractive Index of Sapphire by Laser Displacement Measurement and Theoretical Research

Zheng Cheng; Min Zhu; Yunan Liu; Zeya Huang; Wei Wang; Zhiqiang Shao

doi:10.3788/AOS221911

Acta Optica Sinica, Volume. 43, Issue 9, 0916003(2023)

Determination of High-Temperature Refractive Index of Sapphire by Laser Displacement Measurement and Theoretical Research

Zheng Cheng¹, Min Zhu¹, Yunan Liu¹, Zeya Huang^1、*, Wei Wang², and Zhiqiang Shao²

Author Affiliations

¹College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, Jiangsu , China

²The 49th Research Institute of China Electronics Technology Group Corporation, Harbin 150000, Heilongjiang , China

show less

Abstract Get PDF(in Chinese)

Figures & Tables(13)

Fig. 1. Parallel plate imaging principle

Download full size

Fig. 2. Schematic diagram of optical path

Download full size

Fig. 3. Test principle of laser displacement method. (a) Path of laser displacement; (b) position relation among laser spot, sapphire and CMOS camera

Download full size

Fig. 4. Lattice parameters and model. (a) Schematic diagram of cell parameters of α-Al₂O₃ varying with temperature; (b) schematic diagram of crystal model of α-Al₂O₃ for theoretical calculation

Download full size

Fig. 5. $Δ S$ varying with temperature

Download full size

$Relationship between measured refractive index and temperature. (a) Relationship between measured no of sapphire and temperature; (b) relationship between measured ne of sapphire and temperature$

Fig. 6. Relationship between measured refractive index and temperature. (a) Relationship between measured n_o of sapphire and temperature; (b) relationship between measured n_e of sapphire and temperature

Download full size

$Complex refractive index of α-Al2O3 varying with temperature. (a) [100] crystal orientation; (b) [001] crystal orientation$

Fig. 7. Complex refractive index of α-Al₂O₃varying with temperature. (a) [100] crystal orientation; (b) [001] crystal orientation

Download full size

$Relationship between simulated refractive index of sapphire and temperature$

Fig. 8. Relationship between simulated refractive index of sapphire and temperature

Download full size

Fig. 9. Point K path graph in Brillouin zone

Download full size

Fig. 10. Simulation results of band structure of α-Al₂O₃. (a) Band structure of α-Al₂O₃ crystal; (b) relationship between band gap and temperature

Download full size

Table 1. Parameters of sapphire experimental sample
View table
Table 1. Parameters of sapphire experimental sample
Parameter Size /（mm×mm×mm） Crystal orientation Roughness / $(10^{- 10} m)$ Smoothness /μm
Value 10×10×20 ［100］，［001］ ≤5 ≤5

Table 2. Birefringence of α-Al₂O₃ at wavelength of 445 nm under different temperatures
View table
Table 2. Birefringence of α-Al₂O₃ at wavelength of 445 nm under different temperatures
Temperature /℃ 27 200 400 600 800 1000 1200
n_o-n_e 0.0080 0.0085 0.0091 0.0097 0.0103 0.0109 0.0115

Table 3. Real part of dielectric function of α-Al₂O₃ at wavelength of 445 nm under different temperatures
View table
Table 3. Real part of dielectric function of α-Al₂O₃ at wavelength of 445 nm under different temperatures
Temperature /℃ 27 400 800 1000 1200
ε₁ at［100］crystal orientation /keV 3.193 3.206 3.222 3.229 3.237
ε₁ at［001］crystal orientation /keV 3.148 3.162 3.178 3.186 3.195

Tools

Get Citation

Copy Citation Text

Zheng Cheng, Min Zhu, Yunan Liu, Zeya Huang, Wei Wang, Zhiqiang Shao. Determination of High-Temperature Refractive Index of Sapphire by Laser Displacement Measurement and Theoretical Research[J]. Acta Optica Sinica, 2023, 43(9): 0916003

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Materials

Received: Nov. 1, 2022

Accepted: Dec. 16, 2022

Published Online: May. 9, 2023

The Author Email: Huang Zeya (huangzeya@nuaa.edu.cn)

DOI:10.3788/AOS221911

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Parameters of sapphire experimental sample

Table 1. Parameters of sapphire experimental sample

Table 2. Birefringence of α-Al2O3 at wavelength of 445 nm under different temperatures

Table 2. Birefringence of α-Al2O3 at wavelength of 445 nm under different temperatures

Table 3. Real part of dielectric function of α-Al2O3 at wavelength of 445 nm under different temperatures

Table 3. Real part of dielectric function of α-Al2O3 at wavelength of 445 nm under different temperatures

Table 2. Birefringence of α-Al₂O₃ at wavelength of 445 nm under different temperatures

Table 2. Birefringence of α-Al₂O₃ at wavelength of 445 nm under different temperatures

Table 3. Real part of dielectric function of α-Al₂O₃ at wavelength of 445 nm under different temperatures

Table 3. Real part of dielectric function of α-Al₂O₃ at wavelength of 445 nm under different temperatures