Electronics Optics & Control, Volume. 30, Issue 7, 111(2023)

Remaining Useful Life Prediction for Multi-state Switching Random Degradation Equipment

XING Yuanxing1... ZHANG Jianxun1, MAN Qian2, HU Changhua1, DU Dangbo1 and PEI Hong1 |Show fewer author(s)
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    References(9)

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    [12] [12] ZHANG J X,HU C H,HE X,et al.A novel lifetime estimation method for two-phase degrading systems[J].IEEE Transactions on Reliability,2019,68(2):689-709.

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    [14] [14] ZHANG Z X,SI X S,HU C H,et al.A prognostic model for stochastic degrading systems with state recovery:application to li-ion batteries[J].IEEE Transactions on Reliability,2017,66(4):1293-1308.

    [15] [15] SI X S,WANG W,HU C H,et al.Remaining useful life estimation-a review on the statistical data driven approaches[J].European Journal of Operational Research, 2011,213(1):1-14.

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    XING Yuanxing, ZHANG Jianxun, MAN Qian, HU Changhua, DU Dangbo, PEI Hong. Remaining Useful Life Prediction for Multi-state Switching Random Degradation Equipment[J]. Electronics Optics & Control, 2023, 30(7): 111

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    Paper Information

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    Received: Jun. 28, 2022

    Accepted: --

    Published Online: Nov. 29, 2023

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2023.07.020

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