Infrared and Laser Engineering, Volume. 32, Issue 6, 630(2003)

Measurement of disparity based on sparse-to-dense matching approach

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    [in Chinese], [in Chinese], [in Chinese]. Measurement of disparity based on sparse-to-dense matching approach[J]. Infrared and Laser Engineering, 2003, 32(6): 630

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    Paper Information

    Category: 图像处理

    Received: Sep. 2, 2002

    Accepted: Nov. 10, 2002

    Published Online: Apr. 28, 2006

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