[1] [1] G. Binnig, C. F. Quate, Ch. Gerber. Surface studies by scanning tunneling microssope. Phys. Rev. Lett., 1982, 49(1): 57～60

[2] [2] G. Binnig, C. F. Quate. Atomic force microscope. Phys. Rev. Lett., 1996, 56(9): 930～933

[3] [3] Y. Martin, C. C. Williams, H. K. Wickramsinghe. Atomic force microscopy-force mapping and profile on a sub 10 nm scale. J. Appl. Phys., 1987, 61(2): 4723～4729

[4] [4] W. H. Huang, A. M. Baro, J. J. Sanez. Electrostatic and contact forces in force microscopy. J. Vac. Sci. Technol., 1991, B9(2): 1323～1328

[5] [5] C. Philip, D. Hobbs, W. DavidAbraham et al.. Magnetic force microscopy with 25 nm resolution. Appl. Phys. Lett., 1989, 55(22): 2357～2359

[6] [6] G. Meyer, N. M. Amer. Erratum: Novel optical approach to atomic force nicroscopy. Appl. Phys. Lett., 1988, 53(6): 1045～1049

[7] [7] Minoru Sasaki, Kazuhiro Hane, Shigeru Okuma. Shape of the cantilever deflection for the atomic force microscope in force curve measurement. Rev. Sci. Instrum., 1994, 65(6): 1930～1935

[8] [8] C. Schonenberger, S. F. Alvarado. Force microscope detected by the principle of Normaski. Rev. Sci. Instrum., 1989, 60(3): 3131～3136

[9] [9] S. Watanabe, K. Hane, T. Goto. Force microscopy using a twin path interferometer. J. Vac. Sci. Technol., 1992, B10(1): 1～5

[11] [11] Zzzu. Durig, J. K. Gimzewsk, D. W. Pohl et al.. Noise induced by thermal drift in scanning force microscope. Phys. Rev. Lett., 1986, 57(6): 2403～2407