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INFRARED, Volume. 43, Issue 7, 15(2022)

Study on InSb Infrared Detectors Failure Mechanism Based on Reliability Test

Wei-ting ZHANG*... Ti NI, Zhong-he LI and Chun-ling LI |Show fewer author(s)
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    ZHANG Wei-ting, NI Ti, LI Zhong-he, LI Chun-ling. Study on InSb Infrared Detectors Failure Mechanism Based on Reliability Test[J]. INFRARED, 2022, 43(7): 15

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    Received: Apr. 22, 2022

    Accepted: --

    Published Online: Feb. 20, 2023

    The Author Email: Wei-ting ZHANG (zwt19940921@163.com)

    DOI:10.3969/j.issn.1672-8785.2022.07.003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology