Acta Optica Sinica, Volume. 7, Issue 9, 832(1987)
Calculation of electric fields inside multilayers by using a new thin-film characteristic matrix method
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ZHEN SHUYIN, HAN LITING. Calculation of electric fields inside multilayers by using a new thin-film characteristic matrix method[J]. Acta Optica Sinica, 1987, 7(9): 832
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