Infrared and Laser Engineering, Volume. 52, Issue 12, 20230310(2023)
Quantitative analysis of coaxial zoom laser-induced breakdown spectroscopy
Figures & Tables(14)
Fig. 1. Flowchart of zoom-LIBS correction and quantitative analysis
Fig. 3. Estimated electron density using Stark broadening of 308.22 nm
Fig. 6. Spectral lines involved in the estimation of
Table 1. Main elements content information in samples
View tableView in ArticleTable 1. Main elements content information in samples
Training Si/wt.% Mn/wt.% Mg/wt.% Al/wt.% No. 1 5.49 0.72 0.72 91.16 No. 2 6.60 0.52 0.54 90.71 No. 3 7.61 0.32 0.33 90.55 No. 4 8.29 0.55 0.56 88.88 No. 5 8.93 0.40 0.39 89.12 No. 6 10.20 0.26 0.25 88.57 No. 7 6.71 0.08 0.51 92.07 No. 8 8.40 0.38 0.39 90.07 No. 9 9.99 0.22 0.12 88.61 Prediction Si/wt.% Mn/wt.% Mg/wt.% Al/wt.% No. 10 9.30 0.62 0.26 88.70 No. 11 6.64 0.25 0.35 91.65 No. 12 7.41 0.71 0.71 88.83 No. 13 5.39 0.57 0.56 91.06
Table 2. Electron impact factor
w of Al I 308.22 nmView tableView in ArticleTable 2. Electron impact factor
w of Al I 308.22 nmPlasma temperature/K $ w $ 5000 0.00264 10000 0.00261 20000 0.00250 40000 0.00234
Table 3. Al lines involved in estimating
V 1,V 2 and Saha-Boltzmann methodView tableView in ArticleTable 3. Al lines involved in estimating
V 1,V 2 and Saha-Boltzmann methodWavelength/nm Ionization degree Accuracy Aij/s−1 gi Ei/eV Saha-Boltzmann Estimation of V1 Estimation of V2 308.22 I B+ 5.87×107 4 4.02 Yes Yes - 309.27 I B+ 7.29×107 6 4.02 Yes Yes - 265.25 I B 1.42×107 2 4.67 Yes Yes - 256.80 I B 1.92×107 4 4.83 Yes Yes - 257.51 I C+ 3.60×107 6 4.83 Yes Yes - 237.31 I B 9.07×107 6 5.23 Yes Yes - 305.71 I - - 6 7.67 - Yes - 232.16 I - - 6 8.95 - Yes Yes 281.62 II A 3.57×108 1 11.82 Yes - Yes 466.31 II A+ 5.81×107 3 13.26 Yes - - 358.66 II A 2.35×108 9 15.30 Yes - - 263.15 II B+ 2.48×108 7 15.31 Yes - -
Table 4. The ratio of lines involved in the estimation of
V 1View tableView in ArticleTable 4. The ratio of lines involved in the estimation of
V 1Wavelength/nm Ratio Ei/eV 308.22 2.41 4.02 309.27 2.44 4.02 265.25 2.66 4.67 256.80 3.05 4.83 257.51 2.82 4.83 237.31 3.01 5.23 305.71 4.14 7.69 232.16 4.34 8.95
Table 5. Comparison of two plasma temperature diagnosis methods
View tableView in ArticleTable 5. Comparison of two plasma temperature diagnosis methods
Samples 25 mJ 65 mJ RP/eV S-B/eV RE RP/eV S-B/eV RE No. 10 1.27 1.18 7.6% 1.49 1.49 0 No. 11 1.24 1.16 6.9% 1.55 1.51 2.6% No. 12 1.19 1.14 4.4% 1.52 1.53 1% No. 13 1.23 1.17 5.1% 1.48 1.51 2%
Table 6. Correction results of spectral lines involved in quantitative analysis
View tableView in ArticleTable 6. Correction results of spectral lines involved in quantitative analysis
Lines 25 mJ/arb. units 40 mJ/arb. units Original Corrected Al 308.22 nm 0.74 1.03 1 Al 309.27 nm 0.77 1.06 1 Al 281.62 nm 0.49 0.87 1 Al 466.31 nm 0.46 0.98 1 Si 288.16 nm 0.71 1.06 1 Mg 279.55 nm 0.62 1.04 1 Mn 259.37 nm 0.65 0.95 1
Table 7. Quantitative inversion results of 4 samples
View tableView in ArticleTable 7. Quantitative inversion results of 4 samples
Loc Al/wt.% RE Si/wt.% RE Mn/wt.% RE Mg/wt.% RE Ref 88.70 - 9.30 - 0.62 - 0.26 - No.10 1.5 m 90.13 1.61% 9.21 0.97% 0.55 11.29% 0.24 7.69% 2 m 86.24 2.77% 8.51 8.49% 0.59 4.84% 0.23 11.54% 2.4 m 85.27 3.87% 8.77 5.70% 0.66 6.45% 0.29 11.54% 2.7 m 84.01 5.29% 8.65 6.99% 0.50 19.35% 0.32 23.08% 3 m 85.42 3.70% 8.03 13.66% 0.49 20.97% 0.31 19.23% Ref 91.65 - 6.64 - 0.25 - 0.35 - No.11 1.5 m 92.33 0.74% 5.77 13.10% 0.42 68.00% 0.44 25.71% 2 m 90.24 1.54% 5.57 16.11% 0.31 24.00% 0.45 28.57% 2.4 m 91.18 0.51% 6.11 7.98% 0.35 40.00% 0.32 8.57% 2.7 m 89.01 2.88% 6.28 5.42% 0.27 8.00% 0.42 20.00% 3 m 88.15 3.82% 6.13 7.68% 0.24 4.00% 0.39 11.43% Ref 88.83 - 7.41 - 0.72 - 0.71 - No.12 1.5 m 92.27 3.87% 7.57 2.16% 0.78 8.33% 0.76 7.04% 2 m 89.29 0.52% 7.71 4.05% 0.68 5.56% 0.57 19.72% 2.4 m 90.71 2.12% 6.98 5.80% 0.82 13.89% 0.73 2.82% 2.7 m 86.65 2.45% 7.02 5.26% 0.63 12.50% 0.82 15.49% 3 m 84.14 5.28% 7.98 7.69% 0.71 1.39% 0.63 11.27% Ref 91.06 - 5.39 - 0.57 - 0.56 - No.13 1.5 m 94.21 3.46% 5.01 6.49% 0.72 26.32% 0.69 23.21% 2 m 93.07 2.21% 5.18 3.90% 0.53 7.02% 0.51 8.93% 2.4 m 93.26 2.42% 5.25 2.60% 0.51 10.53% 0.73 30.36% 2.7 m 87.14 4.30% 5.17 4.08% 0.49 14.04% 0.74 32.14% 3 m 88.23 3.11% 4.90 9.09% 0.44 22.81% 0.76 35.71%
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Xin Li, Zhengyi Lv, Bolun Cui, Jiaming Zhang, Ziying Liu, Xun Huang, Tianzhuo Zhao. Quantitative analysis of coaxial zoom laser-induced breakdown spectroscopy[J]. Infrared and Laser Engineering, 2023, 52(12): 20230310
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Received: May. 18, 2023
Accepted: --
Published Online: Feb. 23, 2024
The Author Email: Zhao Tianzhuo (zhaotianzhuo@ucas.ac.cn)
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