High Power Laser Science and Engineering, Volume. 3, Issue 3, 03000001(2015)
An important criterion for reliable multi-monochromatic x-ray imager diagnostics and its impact on the reconstructed images
Fig. 1. (a) The MMI consists of a PHA, a MLM and a MCP. The signal collected through a pinhole is proportional to the source-to-pinhole solid angle, . (b) The spatial resolution is determined by the object–pinhole–detector distances. (c) The magnification is determined by the object–pinhole distance, , and the object–detector distance, . The optimal pinhole separation, , is determined so that images of size do not overlap.
Fig. 2. (a) MMI data with an appropriate PHA tilt. The dashed line is the reference vertical line (i.e., ). The red and green solid lines show the extracted () and optimal () PHA tilt angles. (b) Monochromatic image reconstructed from a single pixel column at the He- line center. (c) Narrow-band He- image reconstructed over its linewidth (i.e., eV).
Fig. 3. (a) MMI data with an inappropriate PHA tilt. The dashed line is the reference vertical line (i.e., ). The red and green solid lines show the extracted () and optimal () PHA tilt angles. (b) Monochromatic image reconstructed from a single pixel column at the He- line center. (c) Narrow-band He- image reconstructed over its linewidth (i.e., eV).
Fig. 4. (a) Synthetic MMI data with an appropriate PHA tilt and with the minimum reconstruction width, , much narrower than the spectral linewidth. (b) Ar He- and Ly- images reconstructed from the synthetic MMI data. (c) Expected Ar He- and Ly- images.
Fig. 5. (a) Synthetic MMI data with an inappropriate PHA tilt and with the minimum reconstruction width, , broader than the spectral linewidth. (b) Ar He- and Ly- images reconstructed from the synthetic MMI data. (c) Expected Ar He- and Ly- images.
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T. Nagayama, R.C. Mancini, D. Mayes, R. Tommasini, R. Florido. An important criterion for reliable multi-monochromatic x-ray imager diagnostics and its impact on the reconstructed images[J]. High Power Laser Science and Engineering, 2015, 3(3): 03000001
Special Issue: PLASMA/LASER DIAGNOSTICS
Received: Apr. 10, 2015
Accepted: Jun. 13, 2015
Published Online: Jan. 7, 2016
The Author Email: T. Nagayama (tnnagay@sandia.gov)