Opto-Electronic Engineering, Volume. 45, Issue 9, 170669(2018)
Advances of key technologies on optical reflectometry with ultra-high spatial resolution
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Wang Shuai, Wang Bin, Liu Qingwen, Du Jiangbing, Fan Xinyu, He Zuyuan. Advances of key technologies on optical reflectometry with ultra-high spatial resolution[J]. Opto-Electronic Engineering, 2018, 45(9): 170669
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Received: Sep. 21, 2017
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Published Online: Oct. 2, 2018
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