Acta Photonica Sinica, Volume. 39, Issue 3, 485(2010)
Calibration of System Error for Interferometer Through Absolute Liquid Reference Method
[1] [1] FRITZ S.Absolute calibration of an optical flat[J].Opt Eng,1984,23(4):379-383.
[2] [2] KEENAN P B.Pseudo-shear interferometry[C].SPIE,1984,123(4):2-9.
[3] [3] LOAD R.Interference bands and their application[J].Nature,1893,48:212-214.
[4] [4] SCHULZ G,SCHWIDER J.Precise measurement of planness[J].Applied Optics,1967,6(6):1077-1084.
[5] [5] FRITZ B S.Absolute calibration of an optical flat[J].Optical Engineering,1984,23(4):379-383.
[6] [6] XU Chen,CHEN Lei.Absolute flatness measurement of optical surface[J].Optical Technique,2006,32(5):775-778.
[7] [7] AI C,WYANT J C.Method and apparatus for absolute measurement of entire surfaces of flats[P].U S Patent:5502566[P].1996.
[9] [9] ZHAO Hua-wei,WANG Jun.A new method of absolute flatness measurement of optical surface errors[J].Applied Optics,1991,12(2):53-55.
[10] [10] ZHU Yu-cong,YANG Guo-guang,DONG Tai-he,et al.Absolute measurement and foundation of standard optical surface[J].Acta Metrologica Sinica,1989,10(4):285-289.
[11] [11] RAYLEJGH L.Interference bands and their applications[J].Nature,1893,48:212-214.
[12] [12] TAN Mu-hua,HUANG Yun-yuan.Physical chemistry of surface[M].Beijing:China Building Industry Press,1995:7-12.
[13] [13] WU Xu-hua,CHEN Lei, SUN Jiao-fen, et al. Application of virtual grating phase-shifting Moiréfringe method to angle departure evaluation of optical components[J]. Acta Metrologica Sinica, 2006,27(3):221-223.
Get Citation
Copy Citation Text
WU Xu-hua, XIA Jiang-tao, XIAO Shao-rong, CHEN Lei. Calibration of System Error for Interferometer Through Absolute Liquid Reference Method[J]. Acta Photonica Sinica, 2010, 39(3): 485